MECHANISM OF ELECTRICAL BREAKDOWN IN SIO2-FILMS

被引：82

作者：

RIDLEY, BK ^{[1
]}

机构：

[1] UNIV ESSEX, DEPT PHYS, COLCHESTER, ENGLAND

来源：

JOURNAL OF APPLIED PHYSICS | 1975年 / 46卷 / 03期

关键词：

D O I：

10.1063/1.321721

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：998 / 1007

页数：10

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