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OBSERVATION OF A VERY NARROW SURFACE RESONANCE ON SINGLE-CRYSTAL ALUMINUM
被引:26
作者
:
HENRICH, VE
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
HENRICH, VE
[
1
]
机构
:
[1]
MIT,LINCOLN LAB,LEXINGTON,MA 02173
来源
:
SURFACE SCIENCE
|
1975年
/ 49卷
/ 02期
关键词
:
D O I
:
10.1016/0039-6028(75)90381-7
中图分类号
:
O64 [物理化学(理论化学)、化学物理学];
学科分类号
:
070304 ;
081704 ;
摘要
:
引用
收藏
页码:675 / 680
页数:6
相关论文
共 10 条
[1]
PLASMON THRESHOLDS IN SECONDARY-ELECTRON YIELD .1. EXPERIMENT
[J].
ANDERSSON, S
论文数:
0
引用数:
0
h-index:
0
ANDERSSON, S
.
SOLID STATE COMMUNICATIONS,
1972,
11
(10)
:1401
-+
[2]
LOW-ENERGY ELECTRON-DIFFRACTION AMPLITUDES
[J].
GERSTEN, JI
论文数:
0
引用数:
0
h-index:
0
GERSTEN, JI
;
MCRAE, EG
论文数:
0
引用数:
0
h-index:
0
MCRAE, EG
.
SURFACE SCIENCE,
1972,
29
(02)
:483
-&
[3]
METHOD OF DETECTING FINE-STRUCTURE IN SECONDARY-ELECTRON EMISSION YIELD AND APPLICATION TO SI(111)
[J].
GOTO, K
论文数:
0
引用数:
0
h-index:
0
GOTO, K
;
ISHIKAWA, K
论文数:
0
引用数:
0
h-index:
0
ISHIKAWA, K
.
JOURNAL OF APPLIED PHYSICS,
1972,
43
(04)
:1559
-+
[4]
FINE STRUCTURES AND ENERGY-DISTRIBUTION OF SECONDARY ELECTRON EMISSION FROM SI(111)
[J].
GOTO, K
论文数:
0
引用数:
0
h-index:
0
机构:
NAGOYA INST TECHNOL, DEPT FINE MEASUREMENTS, SHOWA, NAGOYA, JAPAN
NAGOYA INST TECHNOL, DEPT FINE MEASUREMENTS, SHOWA, NAGOYA, JAPAN
GOTO, K
;
ISHIKAWA, K
论文数:
0
引用数:
0
h-index:
0
机构:
NAGOYA INST TECHNOL, DEPT FINE MEASUREMENTS, SHOWA, NAGOYA, JAPAN
NAGOYA INST TECHNOL, DEPT FINE MEASUREMENTS, SHOWA, NAGOYA, JAPAN
ISHIKAWA, K
.
JOURNAL OF APPLIED PHYSICS,
1973,
44
(01)
:132
-137
[5]
FAST, ACCURATE SECONDARY-ELECTRON YIELD MEASUREMENTS AT LOW PRIMARY ENERGIES
[J].
HENRICH, VE
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
HENRICH, VE
.
REVIEW OF SCIENTIFIC INSTRUMENTS,
1973,
44
(04)
:456
-462
[6]
HENRICH VE, 1974, 34TH ANN C PHYS EL M
[7]
EFFECT OF STEPS ON LEED INTENSITY DATA FOR (110) FACE OF ALUMINUM
[J].
HOUSTOUN, JE
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
HOUSTOUN, JE
;
LARAMORE, GE
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
LARAMORE, GE
;
PARK, RL
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
PARK, RL
.
SURFACE SCIENCE,
1973,
34
(02)
:477
-481
[8]
OBSERVATION OF SURFACE-STATE RESONANCES IN LOW-ENERGY ELECTRON-DIFFRACTION ROTATION DIAGRAMS FOR AL
[J].
LAUZIER, J
论文数:
0
引用数:
0
h-index:
0
LAUZIER, J
;
DEBERSUD.L
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0
引用数:
0
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DEBERSUD.L
;
HOFFSTEIN, V
论文数:
0
引用数:
0
h-index:
0
HOFFSTEIN, V
.
PHYSICAL REVIEW LETTERS,
1971,
27
(11)
:735
-+
[9]
OBSERVATION OF MULTIPLE SCATTERING RESONANCE EFFECTS IN LOW ENERGY ELECTRON DIFFRACTION STUDIES OF LIF NAF AND GRAPHITE
[J].
MCRAE, EG
论文数:
0
引用数:
0
h-index:
0
MCRAE, EG
;
CALDWELL, CW
论文数:
0
引用数:
0
h-index:
0
CALDWELL, CW
.
SURFACE SCIENCE,
1967,
7
(01)
:41
-&
[10]
SURFACE-STATE RESONANCES IN LOW-ENERGY ELECTRON DIFFRACTION
[J].
MCRAE, EG
论文数:
0
引用数:
0
h-index:
0
MCRAE, EG
.
SURFACE SCIENCE,
1971,
25
(03)
:491
-&
←
1
→
共 10 条
[1]
PLASMON THRESHOLDS IN SECONDARY-ELECTRON YIELD .1. EXPERIMENT
[J].
ANDERSSON, S
论文数:
0
引用数:
0
h-index:
0
ANDERSSON, S
.
SOLID STATE COMMUNICATIONS,
1972,
11
(10)
:1401
-+
[2]
LOW-ENERGY ELECTRON-DIFFRACTION AMPLITUDES
[J].
GERSTEN, JI
论文数:
0
引用数:
0
h-index:
0
GERSTEN, JI
;
MCRAE, EG
论文数:
0
引用数:
0
h-index:
0
MCRAE, EG
.
SURFACE SCIENCE,
1972,
29
(02)
:483
-&
[3]
METHOD OF DETECTING FINE-STRUCTURE IN SECONDARY-ELECTRON EMISSION YIELD AND APPLICATION TO SI(111)
[J].
GOTO, K
论文数:
0
引用数:
0
h-index:
0
GOTO, K
;
ISHIKAWA, K
论文数:
0
引用数:
0
h-index:
0
ISHIKAWA, K
.
JOURNAL OF APPLIED PHYSICS,
1972,
43
(04)
:1559
-+
[4]
FINE STRUCTURES AND ENERGY-DISTRIBUTION OF SECONDARY ELECTRON EMISSION FROM SI(111)
[J].
GOTO, K
论文数:
0
引用数:
0
h-index:
0
机构:
NAGOYA INST TECHNOL, DEPT FINE MEASUREMENTS, SHOWA, NAGOYA, JAPAN
NAGOYA INST TECHNOL, DEPT FINE MEASUREMENTS, SHOWA, NAGOYA, JAPAN
GOTO, K
;
ISHIKAWA, K
论文数:
0
引用数:
0
h-index:
0
机构:
NAGOYA INST TECHNOL, DEPT FINE MEASUREMENTS, SHOWA, NAGOYA, JAPAN
NAGOYA INST TECHNOL, DEPT FINE MEASUREMENTS, SHOWA, NAGOYA, JAPAN
ISHIKAWA, K
.
JOURNAL OF APPLIED PHYSICS,
1973,
44
(01)
:132
-137
[5]
FAST, ACCURATE SECONDARY-ELECTRON YIELD MEASUREMENTS AT LOW PRIMARY ENERGIES
[J].
HENRICH, VE
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
HENRICH, VE
.
REVIEW OF SCIENTIFIC INSTRUMENTS,
1973,
44
(04)
:456
-462
[6]
HENRICH VE, 1974, 34TH ANN C PHYS EL M
[7]
EFFECT OF STEPS ON LEED INTENSITY DATA FOR (110) FACE OF ALUMINUM
[J].
HOUSTOUN, JE
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
HOUSTOUN, JE
;
LARAMORE, GE
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
LARAMORE, GE
;
PARK, RL
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
PARK, RL
.
SURFACE SCIENCE,
1973,
34
(02)
:477
-481
[8]
OBSERVATION OF SURFACE-STATE RESONANCES IN LOW-ENERGY ELECTRON-DIFFRACTION ROTATION DIAGRAMS FOR AL
[J].
LAUZIER, J
论文数:
0
引用数:
0
h-index:
0
LAUZIER, J
;
DEBERSUD.L
论文数:
0
引用数:
0
h-index:
0
DEBERSUD.L
;
HOFFSTEIN, V
论文数:
0
引用数:
0
h-index:
0
HOFFSTEIN, V
.
PHYSICAL REVIEW LETTERS,
1971,
27
(11)
:735
-+
[9]
OBSERVATION OF MULTIPLE SCATTERING RESONANCE EFFECTS IN LOW ENERGY ELECTRON DIFFRACTION STUDIES OF LIF NAF AND GRAPHITE
[J].
MCRAE, EG
论文数:
0
引用数:
0
h-index:
0
MCRAE, EG
;
CALDWELL, CW
论文数:
0
引用数:
0
h-index:
0
CALDWELL, CW
.
SURFACE SCIENCE,
1967,
7
(01)
:41
-&
[10]
SURFACE-STATE RESONANCES IN LOW-ENERGY ELECTRON DIFFRACTION
[J].
MCRAE, EG
论文数:
0
引用数:
0
h-index:
0
MCRAE, EG
.
SURFACE SCIENCE,
1971,
25
(03)
:491
-&
←
1
→