Calibrated intensity noise measurements in microcavity laser diodes

被引：21

作者：

Goobar, E

Scott, JW

Thibeault, B

Robinson, G

Akulova, Y

Coldren, LA

机构：

[1] Department of Electrical and Computer Engineering, University of California, Santa Barbara

来源：

APPLIED PHYSICS LETTERS | 1995年 / 67卷 / 25期

关键词：

D O I：

10.1063/1.115353

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Calibrated intensity noise measurements of microcavity lasers diodes are presented. Partition noise due to polarization degeneracy is found to render excess noise that destroys squeezing. The measurements indicate that it may be necessary to introduce polarization control to realize sub-shot-noise levels in microcavity laser diodes. (C) 1995 American Institute of Physics.

引用

收藏

页码：3697 / 3699

页数：3

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