DETECTION OF HOT SPOTS IN THIN METAL-FILMS VIA THERMAL NOISE MEASUREMENTS

被引：9

作者：

MASSIHA, GH

CHEN, TM

SCOTT, GJ

机构：

来源：

IEEE ELECTRON DEVICE LETTERS | 1989年 / 10卷 / 02期

关键词：

D O I：

10.1109/55.32428

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：58 / 60

页数：3

共 12 条

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[4]

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[6]

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[8]

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[9]

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[10] ELECTROMIGRATION AND METALIZATION LIFETIMES [J].

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