OBSERVATION OF INTRINSIC TRISTABILITY IN A RESONANT-TUNNELING STRUCTURE

被引:62
作者
MARTIN, AD [1 ]
LERCH, MLF [1 ]
SIMMONDS, PE [1 ]
EAVES, L [1 ]
机构
[1] UNIV NOTTINGHAM,DEPT PHYS,NOTTINGHAM NG7 2RD,ENGLAND
关键词
D O I
10.1063/1.110854
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new technique has been developed to probe the region of apparent bistability due to a tunneling resonance in the characteristic of a semiconductor asymmetric double-barrier structure. The measuring circuit uses a voltage supply designed to have a load line with positive slope, equivalent to a voltage source and negative series resistance. The appearance of bistability and hysteresis in the characteristic is an artifact of the conventional measuring technique, which employs a load line with negative slope. The complete characteristic is found to be a continuous Z-shaped curve between 50 and 150 K, corresponding to tristability. Equivalent circuit models for the device and voltage supply predict a narrow range of circuit parameters for which a static operating point exists inside the tristable region.
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页码:1248 / 1250
页数:3
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