共 16 条
- [3] PHOTOEMISSION STUDY OF AU SCHOTTKY-BARRIER FORMATION ON GASB, GAAS, AND INP USING SYNCHROTRON RADIATION [J]. PHYSICAL REVIEW B, 1978, 18 (10): : 5545 - 5559
- [4] ENERGY-LEVELS OF SEMICONDUCTOR SURFACE VACANCIES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (05): : 1028 - 1031
- [6] CORRELATION OF GAAS SURFACE-CHEMISTRY AND INTERFACE FERMI-LEVEL POSITION - A SINGLE DEFECT MODEL INTERPRETATION [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03): : 477 - 480
- [7] SEMICONDUCTOR CORE-LEVEL TO VALENCE-BAND MAXIMUM BINDING-ENERGY DIFFERENCES - PRECISE DETERMINATION BY X-RAY PHOTOELECTRON-SPECTROSCOPY [J]. PHYSICAL REVIEW B, 1983, 28 (04): : 1965 - 1977
- [8] EFFECTS OF H2S ADSORPTION ON SURFACE-PROPERTIES OF GAAS (100) GROWN INSITU BY MBE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (05): : 1134 - 1140
- [10] CHEMISORPTION-INDUCED DEFECTS ON GAAS(110) SURFACES [J]. PHYSICAL REVIEW LETTERS, 1982, 48 (07) : 512 - 515