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DOPING OF EPITAXIAL CVD SILICON WITH ARSENIC OR PHOSPHORUS .2. NON-STEADY STATE CONDITIONS
被引:4
作者
:
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
机构
:
来源
:
CRYSTAL RESEARCH AND TECHNOLOGY
|
1985年
/ 20卷
/ 06期
关键词
:
D O I
:
10.1002/crat.2170200605
中图分类号
:
O7 [晶体学];
学科分类号
:
0702 ;
070205 ;
0703 ;
080501 ;
摘要
:
引用
收藏
页码:741 / 747
页数:7
相关论文
共 8 条
[1]
KOSCA G, 1983, CRYST RES TECHNOL, V18, P1533
[2]
DOPING OF EPITAXIAL CVD SILICON WITH ARSENIC OR PHOSPHORUS .1. STEADY-STATE CONDITIONS
[J].
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1985,
20
(04)
:479
-484
[3]
ON THE ADSORPTION-REFERRED AND EQUILIBRIUM-REFERRED INTERPRETATION OF THE DOPING ELEMENT INCORPORATION DURING THE GROWTH OF CVD EPITAXIAL SILICON
[J].
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1983,
18
(11)
:1377
-1384
[4]
ACTIVITY-COEFFICIENT AND INCORPORATION OF PHOSPHORUS INTO EPITAXIAL CVD SILICON
[J].
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1984,
19
(09)
:1215
-1223
[5]
INCORPORATION OF DOPANTS INTO EPITAXIAL CVD-SILICON LAYERS AND INCORPORATION EQUILIBRIUM
[J].
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1982,
17
(11)
:1379
-1387
[6]
TOTAL PRESSURE-DEPENDENCE OF DOPING ELEMENT INCORPORATION DURING THE CHEMICAL VAPOR-DEPOSITION OF EPITAXIAL SILICON
[J].
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1982,
17
(02)
:181
-187
[7]
TRANSIENT AND STEADY-STATE RESPONSE OF DOPANT SYSTEM OF A SILICON EPITAXIAL REACTOR - TRANSFER-FUNCTION APPROACH
[J].
REIF, R
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304
HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304
REIF, R
;
KAMINS, TI
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304
HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304
KAMINS, TI
;
SARASWAT, K
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304
HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304
SARASWAT, K
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(11)
:1860
-1866
[8]
COMPUTER-SIMULATION IN SILICON EPITAXY
[J].
REIF, R
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
REIF, R
;
DUTTON, RW
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
DUTTON, RW
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1981,
128
(04)
:909
-918
←
1
→
共 8 条
[1]
KOSCA G, 1983, CRYST RES TECHNOL, V18, P1533
[2]
DOPING OF EPITAXIAL CVD SILICON WITH ARSENIC OR PHOSPHORUS .1. STEADY-STATE CONDITIONS
[J].
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1985,
20
(04)
:479
-484
[3]
ON THE ADSORPTION-REFERRED AND EQUILIBRIUM-REFERRED INTERPRETATION OF THE DOPING ELEMENT INCORPORATION DURING THE GROWTH OF CVD EPITAXIAL SILICON
[J].
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1983,
18
(11)
:1377
-1384
[4]
ACTIVITY-COEFFICIENT AND INCORPORATION OF PHOSPHORUS INTO EPITAXIAL CVD SILICON
[J].
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1984,
19
(09)
:1215
-1223
[5]
INCORPORATION OF DOPANTS INTO EPITAXIAL CVD-SILICON LAYERS AND INCORPORATION EQUILIBRIUM
[J].
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1982,
17
(11)
:1379
-1387
[6]
TOTAL PRESSURE-DEPENDENCE OF DOPING ELEMENT INCORPORATION DURING THE CHEMICAL VAPOR-DEPOSITION OF EPITAXIAL SILICON
[J].
KUHNE, H
论文数:
0
引用数:
0
h-index:
0
KUHNE, H
.
CRYSTAL RESEARCH AND TECHNOLOGY,
1982,
17
(02)
:181
-187
[7]
TRANSIENT AND STEADY-STATE RESPONSE OF DOPANT SYSTEM OF A SILICON EPITAXIAL REACTOR - TRANSFER-FUNCTION APPROACH
[J].
REIF, R
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304
HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304
REIF, R
;
KAMINS, TI
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304
HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304
KAMINS, TI
;
SARASWAT, K
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304
HEWLETT PACKARD CO,LABS,PALO ALTO,CA 94304
SARASWAT, K
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(11)
:1860
-1866
[8]
COMPUTER-SIMULATION IN SILICON EPITAXY
[J].
REIF, R
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
REIF, R
;
DUTTON, RW
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
DUTTON, RW
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1981,
128
(04)
:909
-918
←
1
→