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NEGATIVE DIFFERENTIAL RESISTANCE IN GAAS-MESFETS
被引:9
作者
:
FJELDLY, TA
论文数:
0
引用数:
0
h-index:
0
FJELDLY, TA
JOHANNESSEN, JS
论文数:
0
引用数:
0
h-index:
0
JOHANNESSEN, JS
机构
:
来源
:
ELECTRONICS LETTERS
|
1983年
/ 19卷
/ 17期
关键词
:
D O I
:
10.1049/el:19830441
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:649 / 650
页数:2
相关论文
共 4 条
[1]
IV CHARACTERISTICS OF GAAS-MESFET WITH NONUNIFORM DOPING PROFILE
SHUR, MS
论文数:
0
引用数:
0
h-index:
0
机构:
CORNELL UNIV,SCH ELECT ENGN,ITHACA,NY 14853
CORNELL UNIV,SCH ELECT ENGN,ITHACA,NY 14853
SHUR, MS
EASTMAN, LF
论文数:
0
引用数:
0
h-index:
0
机构:
CORNELL UNIV,SCH ELECT ENGN,ITHACA,NY 14853
CORNELL UNIV,SCH ELECT ENGN,ITHACA,NY 14853
EASTMAN, LF
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(02)
: 455
-
461
[2]
ANALYTICAL MODEL OF GAAS MESFETS
SHUR, MS
论文数:
0
引用数:
0
h-index:
0
机构:
WAYNE STATE UNIV,DETROIT,MI 48201
WAYNE STATE UNIV,DETROIT,MI 48201
SHUR, MS
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1978,
25
(06)
: 612
-
618
[3]
WILLING HA, 1977, ELECTRON LETT, V18, P537
[4]
2-DIMENSIONAL NUMERICAL-ANALYSIS OF STABILITY-CRITERIA OF GAAS FETS
YAMAGUCHI, K
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CENT RES LAB,TOKYO 185,JAPAN
HITACHI LTD,CENT RES LAB,TOKYO 185,JAPAN
YAMAGUCHI, K
ASAI, S
论文数:
0
引用数:
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h-index:
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机构:
HITACHI LTD,CENT RES LAB,TOKYO 185,JAPAN
HITACHI LTD,CENT RES LAB,TOKYO 185,JAPAN
ASAI, S
KODERA, H
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CENT RES LAB,TOKYO 185,JAPAN
HITACHI LTD,CENT RES LAB,TOKYO 185,JAPAN
KODERA, H
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1976,
23
(12)
: 1283
-
1290
←
1
→
共 4 条
[1]
IV CHARACTERISTICS OF GAAS-MESFET WITH NONUNIFORM DOPING PROFILE
SHUR, MS
论文数:
0
引用数:
0
h-index:
0
机构:
CORNELL UNIV,SCH ELECT ENGN,ITHACA,NY 14853
CORNELL UNIV,SCH ELECT ENGN,ITHACA,NY 14853
SHUR, MS
EASTMAN, LF
论文数:
0
引用数:
0
h-index:
0
机构:
CORNELL UNIV,SCH ELECT ENGN,ITHACA,NY 14853
CORNELL UNIV,SCH ELECT ENGN,ITHACA,NY 14853
EASTMAN, LF
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(02)
: 455
-
461
[2]
ANALYTICAL MODEL OF GAAS MESFETS
SHUR, MS
论文数:
0
引用数:
0
h-index:
0
机构:
WAYNE STATE UNIV,DETROIT,MI 48201
WAYNE STATE UNIV,DETROIT,MI 48201
SHUR, MS
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1978,
25
(06)
: 612
-
618
[3]
WILLING HA, 1977, ELECTRON LETT, V18, P537
[4]
2-DIMENSIONAL NUMERICAL-ANALYSIS OF STABILITY-CRITERIA OF GAAS FETS
YAMAGUCHI, K
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CENT RES LAB,TOKYO 185,JAPAN
HITACHI LTD,CENT RES LAB,TOKYO 185,JAPAN
YAMAGUCHI, K
ASAI, S
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CENT RES LAB,TOKYO 185,JAPAN
HITACHI LTD,CENT RES LAB,TOKYO 185,JAPAN
ASAI, S
KODERA, H
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CENT RES LAB,TOKYO 185,JAPAN
HITACHI LTD,CENT RES LAB,TOKYO 185,JAPAN
KODERA, H
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1976,
23
(12)
: 1283
-
1290
←
1
→