PROCESS AND DEVICE MODELING FOR VLSI

被引：38

作者：

SELBERHERR, S

机构：

来源：

MICROELECTRONICS RELIABILITY | 1984年 / 24卷 / 02期

关键词：

D O I：

10.1016/0026-2714(84)90450-5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：225 / 257

页数：33

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