STRUCTURAL AND ELECTROOPTIC PROPERTIES OF LASER ABLATED BI4TI3O12 THIN-FILMS ON SRTIO3(100) AND SRTIO3(110)

被引：43

作者：

JO, W

YI, GC

NOH, TW

KO, DK

CHO, YS

KWUN, SI

机构：

[1] Department of Physics, Seoul National University, 151-742, Seoul

来源：

APPLIED PHYSICS LETTERS | 1992年 / 61卷 / 13期

关键词：

D O I：

10.1063/1.107534

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Bi4Ti3O12 thin films have been grown by laser ablation on SrTiO3(100) and SrTiO3(110) substrates. Substrate surface orientation is found to be an important growth parameter which determines crystal axis orientation, grain growth behavior, and electro-optic properties of the Bi4Ti3O12 thin films. The films grown on SrTiO3(110) shows a ferroelectric phase transition near 720-degrees-C and a large quadratic electro-optic effect with the effective coefficient 1.1 X 10(-16) m2/v 2.

引用

收藏

页码：1516 / 1518

页数：3

相关论文

共 10 条

[1] PULSED LASER DEPOSITION AND FERROELECTRIC CHARACTERIZATION OF BISMUTH TITANATE FILMS [J].

BUHAY, H ;

SINHAROY, S ;

KASNER, WH ;

FRANCOMBE, MH ;

LAMPE, DR ;

STEPKE, E .

APPLIED PHYSICS LETTERS, 1991, 58 (14) :1470-1472

[2] TEXTURE ANALYSIS OF SMOOTH INSITU LASER ABLATED YBA2CU3O7 THIN-FILMS ON (100)SRTIO3 [J].

CILLESSEN, JFM ;

DELEEUW, DM ;

KINNEGING, AJ ;

ZALM, PC ;

BONGERS, PF .

JOURNAL OF APPLIED PHYSICS, 1990, 68 (12) :6507-6509

[3]

GEBALLE TH, 1991, APPL PHYS LETT, V59, P1782

[4] ELECTROOPTIC CHARACTERIZATION OF ION-BEAM SPUTTER-DEPOSITED KNBO3 THIN-FILMS [J].

GRAETTINGER, TM ;

ROU, SH ;

AMEEN, MS ;

AUCIELLO, O ;

KINGON, AI .

APPLIED PHYSICS LETTERS, 1991, 58 (18) :1964-1966

[5] PIEZOELECTRICITY OF C-AXIS ORIENTED PBTIO3 THIN-FILMS [J].

KUSHIDA, K ;

TAKEUCHI, H .

APPLIED PHYSICS LETTERS, 1987, 50 (25) :1800-1801

[6] ELECTROOPTIC EFFECTS OF ELECTRON-CYCLOTRON RESONANCE PLASMA-SPUTTERED BI12SIO20 THIN-FILMS ON SAPPHIRE [J].

NOMURA, K ;

OGAWA, H .

JOURNAL OF APPLIED PHYSICS, 1991, 70 (06) :3234-3238

[7] EPITAXIAL-GROWTH OF FERROELECTRIC BISMUTH TITANATE THIN-FILMS BY PULSED LASER DEPOSITION [J].

RAMESH, R ;

LUTHER, K ;

WILKENS, B ;

HART, DL ;

WANG, E ;

TARASCON, JM ;

INAM, A ;

WU, XD ;

VENKATESAN, T .

APPLIED PHYSICS LETTERS, 1990, 57 (15) :1505-1507

[8] STRESS-INDUCED SHIFT OF THE CURIE-POINT IN EPITAXIAL PBTIO3 THIN-FILMS [J].

ROSSETTI, GA ;

CROSS, LE ;

KUSHIDA, K .

APPLIED PHYSICS LETTERS, 1991, 59 (20) :2524-2526

[9]

WU AY, 1990, MATER RES SOC SYMP P, V200, P261, DOI 10.1557/PROC-200-261

[10] OPTICAL SWITCHING CHARACTERISTICS OF EPITAXIAL BISMUTH TITANATE FILMS FOR MATRIX-ADDRESSED DISPLAYS [J].

WU, SY ;

TAKEI, WJ ;

FRANCOMBE, MH .

FERROELECTRICS, 1976, 10 (1-4) :209-213