FAILURES INDUCED BY ELECTROMIGRATION IN ECL 100K DEVICES

被引：6

作者：

CANALI, C

FANTINI, F

ZANONI, E

GIOVANNETTI, A

BRAMBILLA, P

机构：

[1] TELETTRA SPA,DEPT QUAL & RELIABIL,BOLOGNA,ITALY

[2] IST FIS,I-41100 MODENA,ITALY

[3] TELETTRA SPA,DEPT QUAL & RELIABIL,I-20059 VIMERCATE,ITALY

来源：

MICROELECTRONICS AND RELIABILITY | 1984年 / 24卷 / 01期

关键词：

D O I：

10.1016/0026-2714(84)90641-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：77 / 100

页数：24

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