ON THE PRECISION AND ACCURACY OF THIN TARGET PIXE ANALYSIS

被引：7

作者：

BUDNAR, M

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1989年 / 42卷 / 01期

关键词：

D O I：

10.1016/0168-583X(89)90016-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：122 / 126

页数：5

共 20 条

[1] EXPERIMENTAL AND THEORETICAL CALIBRATION OF A PIXE SETUP FOR K AND L X-RAYS [J].

BORBELYKISS, I ;

KOLTAY, E ;

LASZLO, S ;

SZABO, G ;

ZOLNAI, L .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 12 (04) :496-504

[2] MEASUREMENTS OF PROTON-INDUCED L-SHELL X-RAY CROSS-SECTIONS ON THIN LU, W, AU, TL, PB, TH AND U TARGETS [J].

BUDNAR, M ;

CINDRO, V ;

KREGAR, M ;

RAVNIKAR, M ;

RAMSAK, V ;

SMIT, Z .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 3 (1-3) :39-42

[3] SOME IMPROVEMENTS ON A SCATTERING CHAMBER FOR PIXE [J].

BUDNAR, M ;

KREGAR, M ;

MIKLAVZIC, U ;

RAMSAK, V ;

RAVNIKAR, M ;

RUPNIK, Z ;

VALKOVIC, V .

NUCLEAR INSTRUMENTS & METHODS, 1981, 179 (02) :249-258

[4] ABSORPTION-EDGE TECHNIQUE FOR DETERMINATION OF INTRINSIC GE DETECTOR PARAMETERS [J].

BUDNAR, M ;

GLAVIC, D ;

KODRE, A ;

SMIT, Z .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 31 (03) :456-461

[5] PRECISION OF PIXE ANALYSIS OF THIN FLUID-RESIDUE SPECIMENS USING INTERNAL STANDARDS [J].

CAMPBELL, JL ;

TEESDALE, WJ ;

LEIGH, RG .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 6 (03) :551-557

[6] EFFICIENCY CALIBRATION OF SEMICONDUCTOR X-RAY DETECTORS IN ENERGY RANGE 3-200 KEV [J].

CAMPBELL, JL ;

MCNELLES, LA .

NUCLEAR INSTRUMENTS & METHODS, 1972, 101 (01) :153-&

[7] AN INTERCOMPARISON OF SPECTRAL DATA-PROCESSING TECHNIQUES IN PIXE [J].

CAMPBELL, JL ;

MAENHAUT, W ;

BOMBELKA, E ;

CLAYTON, E ;

MALMQVIST, K ;

MAXWELL, JA ;

PALLON, J ;

VANDENHAUTE, J .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 14 (02) :204-220

[8]

DECONNINCK G, 1975, ATOM ENERGY REV, V13, P367

[9] SENSITIVITY IN TRACE-ELEMENT ANALYSIS BY P, ALPHA AND O-16 INDUCED X-RAYS [J].

FOLKMANN, F ;

BORGGREEN, J ;

KJELDGAARD, A .

NUCLEAR INSTRUMENTS & METHODS, 1974, 119 (01) :117-123

[10] CHOICE OF PHYSICAL PARAMETERS IN CHARGED-PARTICLE INDUCED X-RAY-FLUORESCENCE ANALYSIS [J].

HERMAN, AW ;

MCNELLES, LA ;

CAMPBELL, JL .

INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES, 1973, 24 (12) :677-688

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