FREQUENCY-DEPENDENCE OF ELECTRON CONDUCTIVITY IN SILICON INVERSION LAYER IN METALLIC AND LOCALIZED REGIMES

被引：96

作者：

ALLEN, SJ ^{[1
]}

TSUI, DC ^{[1
]}

DEROSA, F ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

PHYSICAL REVIEW LETTERS | 1975年 / 35卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.35.1359

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：1359 / 1362

页数：4

相关论文

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