THE IMPACT OF MICROELECTRONICS ON PARTICLE-DETECTION

被引：10

作者：

HEIJNE, EHM

JARRON, P

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1984年 / 226卷 / 01期

关键词：

D O I：

10.1016/0168-9002(84)90158-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：12 / 15

页数：4

共 10 条

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