共 14 条
[2]
VARIATION IN THE STOICHIOMETRY OF THIN SILICON-NITRIDE INSULATING FILMS ON SILICON AND ITS CORRELATION WITH MEMORY TRAPS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1982, 20 (03)
:484-487
[4]
CODY GD, 1984, B AM PHYS SOC, V29, P255
[6]
DIRECT MEASUREMENT OF GAP-STATE ABSORPTION IN HYDROGENATED AMORPHOUS-SILICON BY PHOTOTHERMAL DEFLECTION SPECTROSCOPY
[J].
PHYSICAL REVIEW B,
1982, 25 (08)
:5559-5562
[7]
PHOTOTHERMAL DEFLECTION SPECTROSCOPY AND DETECTION
[J].
APPLIED OPTICS,
1981, 20 (08)
:1333-1344
[8]
LENAHAN PM, COMMUNICATION