THERMAL PROFILES DURING RECRYSTALLIZATION OF SILICON ON INSULATOR WITH SCANNING INCOHERENT-LIGHT LINE SOURCES

被引:20
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KUBOTA, K
HUNT, CE
FREY, J
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D O I
10.1063/1.95741
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O59 [应用物理学];
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页码:1153 / 1155
页数:3
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