EFFECT OF NITRIDATION OF SILICON DIOXIDE ON ITS INFRARED-SPECTRUM

被引:71
作者
NAIMAN, ML [1 ]
KIRK, CT [1 ]
AUCOIN, RJ [1 ]
TERRY, FL [1 ]
WYATT, PW [1 ]
SENTURIA, SD [1 ]
机构
[1] MIT,CAMBRIDGE,MA 02139
关键词
D O I
10.1149/1.2115648
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:637 / 640
页数:4
相关论文
共 17 条
  • [1] AUCOIN RJ, 1981, J ELCHEM SO, V128, pC364
  • [2] THICKNESS MEASUREMENTS OF SILICON DIOXIDE FILMS ON SILICON BY INFRARED ABSORPTION TECHNIQUES
    DIAL, JE
    GONG, RE
    FORDEMWALT, JN
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1968, 115 (03) : 326 - +
  • [3] VIBRATIONAL SPECTRA AND STRUCTURE OF TRISILYLAMINE AND TRISILYLAMINE-D9
    EBSWORTH, EAV
    HALL, JR
    MACKILLOP, MJ
    MCKEAN, DC
    SHEPPARD, N
    WOODWARD, LA
    [J]. SPECTROCHIMICA ACTA, 1958, 13 (03): : 202 - 211
  • [4] OXYNITRIDE DEPOSITION KINETICS IN A SIH4-CO2-NH3-H-2 SYSTEM
    GAIND, AK
    ACKERMANN, GK
    LUCARINI, VJ
    BRATTER, RL
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (04) : 599 - 606
  • [5] THERMAL NITRIDATION OF SILICON DIOXIDE FILMS
    HABRAKEN, FHPM
    KUIPER, AET
    TAMMINGA, Y
    [J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (10) : 6996 - 7002
  • [6] NITRIDATION OF SILICON AND OXIDIZED-SILICON
    HAYAFUJI, Y
    KAJIWARA, K
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (09) : 2102 - 2108
  • [7] DIRECT THERMAL NITRIDATION OF SILICON DIOXIDE FILMS IN ANHYDROUS AMMONIA GAS
    ITO, T
    NOZAKI, T
    ISHIKAWA, H
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (09) : 2053 - 2057
  • [8] LATTICE ABSORPTION BANDS IN SILICON
    JOHNSON, FA
    [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1959, 73 (470): : 265 - 272
  • [9] Naiman M. L., 1980, International Electron Devices Meeting. Technical Digest, P562
  • [10] PHILLIP HR, 1953, J APPL PHYS, V50, P1053