GROWTH OF N-ZNSE AND P-ZNSE BY GAS-SOURCE MOLECULAR-BEAM EPITAXY USING METAL ZN AND H2SE

被引:9
作者
IMAIZUMI, M
ENDOH, Y
OHTSUKA, K
ISU, T
机构
[1] Semiconductor Research Laboratory, Mitsubishi Electric Corporation, Amagasaki, Hyogo, 661, 8-1-1, Tsukaguchi-honmachi
关键词
D O I
10.1016/0022-0248(94)90441-3
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Undoped, n- and p-ZnSe films were successfully grown on GaAs substrates by gas source molecular beam epitaxy using metal Zn and H2Se as sources. Ga and N were used as n- and p-type dopant, respectively. With increasing temperature of the Ga cell, the electron concentration increased from 2.0X10(16) to 1.2X10(18) cm-3 and the electron mobility decreased from 418 to 235 cm2/V. s. These values of the electron mobility indicate that high quality n-type ZnSe films were grown. N doping was performed using active-nitrogen generated by radio-frequency plasma. The net acceptor concentration of the ZnSe film was 4.6X10(17) CM-3. The resistivity of the N-doped ZnSe films strongly depended on the growth conditions. At a growth temperature of 250-degrees-C, a ZnSe film whose resistivity was as low as 6.9 OMEGA cm was obtained.
引用
收藏
页码:366 / 370
页数:5
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