共 8 条
[1]
BAYLISS CR, 1979, J PHYS D, V9, P233
[2]
DECONVOLUTION OF CONCENTRATION DEPTH PROFILES FROM ANGLE RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY DATA
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1985, 3 (05)
:1973-1981
[4]
AN X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY ON OZONE TREATED GAAS-SURFACES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1986, 4 (03)
:984-988
[5]
ON THE FERMI LEVEL PINNING BEHAVIOR OF METAL/III-V SEMICONDUCTOR INTERFACES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1986, 4 (04)
:931-938
[8]
HIGH-RESOLUTION GAS-PHASE PHOTOELECTRON-SPECTRA USING SYNCHROTRON RADIATION - XE 4D LINEWIDTHS AND THE 4D5/2-4D3/2 BRANCHING RATIO
[J].
PHYSICAL REVIEW A,
1985, 31 (03)
:1529-1534