ION IMPACT ETCH ANISOTROPY DOWNSTREAM FROM DIFFUSION PLASMA SOURCES

被引:4
作者
GOECKNER, MJ [1 ]
GOREE, J [1 ]
SHERIDAN, TE [1 ]
机构
[1] UNIV IOWA,DEPT PHYS & ASTRON,IOWA CITY,IA 52242
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1991年 / 9卷 / 06期
关键词
D O I
10.1116/1.577142
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Plasma processing in chambers located downstream from a source are gaining widespread use because they allow etching and deposition with minimal damage. This minimized damage, however, is achieved by using a low ion impact energy, which can lead to a poorer etch anisotropy. The best anisotropy for a given impact energy requires the lowest possible ion temperature. Laser-induced fluorescence measurements show that room temperature ions can be attained using a multidipole-confined discharge. In comparison, ion temperatures downstream from electron cyclotron resonance sources are much hotter, according to recent reports.
引用
收藏
页码:3178 / 3180
页数:3
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