SUBFEMTOJOULE DEEP SUBMICROMETER-GATE CMOS BUILT IN ULTRA-THIN SI FILM ON SIMOX SUBSTRATES

被引:13
作者
MIKI, H [1 ]
OHMAMEUDA, T [1 ]
KUMON, M [1 ]
ASADA, K [1 ]
SUGANO, T [1 ]
OMURA, Y [1 ]
IZUMI, K [1 ]
SAKAI, T [1 ]
机构
[1] NIPPON TELEGRAPH & TEL PUBL CORP, LSI LABS, ATSUGI, KANAGAWA 24301, JAPAN
关键词
D O I
10.1109/16.69919
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Deep submicrometer gate MOSFET with fully depleted channel was fabricated using ultra-thin Si film on SIMOX (Separation by IMplanted OXygen) substrates. Ultra-thin Si films such as 30 nm in thickness were shown to be effective to suppress short-channel effects, thus deep submicrometer gate MOSFET's with steep subthreshold slope and threshld voltage insensitive to drain voltage were realized. Fifty-one stages CMOS ring oscillators with 0.25-mu-m gate built in Si film of 100 nm in thickness showed delay per gate of 21.5 ps at room temperature for supply voltage of 2.5 V. With 30-nm Si film, CMOS ring oscillators demonstrated power-delay product of 0.5 fJ for supply voltage of 1.5 V also at room temperature.
引用
收藏
页码:373 / 377
页数:5
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