DC MAGNETIC FORCE MICROSCOPY IMAGING OF THIN-FILM RECORDING HEAD

被引：13

作者：

RICE, P

MORELAND, J

WADAS, A

机构：

[1] Electromagnetic Technology Division, National Institute of Standards and Technology, Boulder

来源：

JOURNAL OF APPLIED PHYSICS | 1994年 / 75卷 / 10期

关键词：

D O I：

10.1063/1.356978

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Using a new form of magnetic force microscope (dc MFM) magnetic force images of a thin-film recording head have been made. Using dc MFM, atomic force microscope images are presented of the surface topography and magnetic forces taken simultaneously, allowing direct correlation of magnetic fields to the pole pieces. Magnetic force images of the head at typical head-to-disk spacings are presented. The tips used for these images had two different magnetic coatings.

引用

收藏

页码：6878 / 6880

页数：3

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