MAGNETIC FORCE MICROSCOPY OF RECORDING-HEADS

被引：12

作者：

WAGO, K

SUEOKA, K

SAI, F

机构：

[1] IBM Research, Tokyo Research Laboratory, Chiyoda-ku, Tokyo, 102, 5–19, Sanbancho

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1991年 / 27卷 / 06期

关键词：

D O I：

10.1109/20.278779

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Magnetic force microscopy (MFM) images of a thin-film head and metal-in-gap (MIG) heads are presented. Results for the thin-film head show that it is possible to image a high-frequency magnetic field up to at least 50 MHz by using an iron-coated tip. MFM images of the MIG heads indicate intrinsic features such as the effect of the high saturation magnetic flux density of Sendust, a magnetic boundary at the interface of the Sendust and ferrite, electrical resonance, and a frequency limit beyond which these heads cannot excite magnetic fields.

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收藏

页码：5178 / 5180

页数：3

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