DEEP-LEVEL SPECTROSCOPY OF REACTIVELY SPUTTERED A-SI-H FILMS

被引:1
作者
JUNG, AL
LUO, JS
YAO, X
LIN, CH
YANG, YW
ADLER, D
机构
关键词
D O I
10.1016/0022-3093(83)90057-1
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
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页码:241 / 250
页数:10
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