CORRELATION BETWEEN FERMI LEVEL STABILIZATION POSITIONS AND MAXIMUM FREE CARRIER CONCENTRATIONS IN III-V COMPOUND SEMICONDUCTORS

被引:41
作者
TOKUMITSU, E
机构
[1] AT and T Bell Laboratories, Crawford Hill Laboratory, Holmdel, NJ
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1990年 / 29卷 / 05期
关键词
Amphoteric native defect; Autocompensation; Doping; Fermi-level stabilization; Free carrier concentration; Lll-V compound semiconductors;
D O I
10.1143/JJAP.29.L698
中图分类号
O59 [应用物理学];
学科分类号
摘要
Maximum carrier concentrations reported in the literature are compared with the respective Fermi level stabilization positions for various semiconductors. It is shown that heavy n-type (p-type) doping is obtainable for a semiconductor whose Fermi level stabilization position is located near the conduction (valence) band edge. © 1990 The Japan Society of Applied Physics.
引用
收藏
页码:L698 / L701
页数:4
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