A STUDY OF THE SI(111)-SQUARE-ROOT-3X-SQUARE-ROOT-3-AG SURFACE BY TRANSMISSION-X-RAY DIFFRACTION AND X-RAY-DIFFRACTION TOPOGRAPHY

被引：59

作者：

TAKAHASHI, T ^{[1
]}

NAKATANI, S ^{[1
]}

OKAMOTO, N ^{[1
]}

ISHIKAWA, T ^{[1
]}

KIKUTA, S ^{[1
]}

机构：

[1] UNIV TOKYO, FAC ENGN,DEPT APPL PHYS,BUNKYO KU, TOKYO 113, JAPAN

来源：

SURFACE SCIENCE | 1991年 / 242卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(91)90241-J

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The adsorption site of Ag atoms with respect to the unreconstructed Si crystal was uniquely determined using transmission X-ray diffraction. The result is consistent with one of the two honeycomb-chained triangle models previously proposed by the authors using reflection X-ray diffraction. Next, the reconstruction of Si was analyzed; an Si trimer layer is about 0.8 angstrom below the Ag layer, and at least two double layers of Si are reconstructed, having the component of the honeycomb arrangement. Finally, the capability of surface X-ray diffraction topography was shown by observing the integral-order spot near the Bragg point.

引用

页码：54 / 58

页数：5

共 11 条

[1] NOBLE-METAL ADSORPTION ON SI(111) - MEDIUM-ENERGY ION-SCATTERING RESULTS FOR THE AG(SQUARE ROOT-3XSQUARE ROOT-3)R 30-DEGREES RECONSTRUCTION [J].

COPEL, M ;

TROMP, RM .

PHYSICAL REVIEW B, 1989, 39 (17) :12688-12694

[2] RHEED INTENSITY ANALYSIS OF SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AG STRUCTURE [J].

ICHIMIYA, A ;

KOHMOTO, S ;

FUJII, T ;

HORIO, Y .

APPLIED SURFACE SCIENCE, 1989, 41-2 :82-87

[3]

KATAYAMA M, 1988, 2ND INT C FORM SEM I, P105

[4] REINVESTIGATION OF THE STRUCTURE OF SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AG SURFACE [J].

KONO, S ;

ABUKAWA, T ;

NAKAMURA, N ;

ANNO, K .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1989, 28 (07) :L1278-L1281

[5] STRUCTURAL STUDY OF AG OVERLAYERS DEPOSITED ON A SI(111) SUBSTRATE BY IMPACT-COLLISION ION-SCATTERING-SPECTROSCOPY WITH TIME-OF-FLIGHT DETECTION [J].

SUMITOMO, K ;

TANAKA, K ;

IZAWA, Y ;

KATAYAMA, I ;

SHOJI, F ;

OURA, K ;

HANAWA, T .

APPLIED SURFACE SCIENCE, 1989, 41-2 :112-117

[6]

TAKAHASHI T, 1987, SURF SCI, V191, pL825, DOI 10.1016/S0039-6028(87)81179-2

[7] STUDIES ON SI(111)-SQUARE-ROOT X SQUARE-ROOT-3-BI AND -AG SURFACES BY X-RAY-DIFFRACTION UNDER NEARLY NORMAL INCIDENCE [J].

TAKAHASHI, T ;

NAKATANI, S ;

OKAMOTO, N ;

ISHIKAWA, T ;

KIKUTA, S .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (07) :2365-2368

[8] STUDY ON THE SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AG SURFACE-STRUCTURE BY X-RAY-DIFFRACTION [J].

TAKAHASHI, T ;

NAKATANI, S ;

OKAMOTO, N ;

ISHIKAWA, T ;

KIKUTA, S .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1988, 27 (05) :L753-L755

[9] LOCAL ELECTRON-STATES AND SURFACE GEOMETRY OF SI(111)-(SQUARE-ROOT 3 X SQUARE-ROOT 3)AG [J].

VANLOENEN, EJ ;

DEMUTH, JE ;

TROMP, RM ;

HAMERS, RJ .

PHYSICAL REVIEW LETTERS, 1987, 58 (04) :373-376

[10] THE STRUCTURE OF SI(111)-(SQUARE-ROOT-3X SQUARE-ROOT-3)R30-DEGREES-AG DETERMINED BY SURFACE X-RAY-DIFFRACTION [J].

VLIEG, E ;

VANDERGON, AWD ;

VANDERVEEN, JF ;

MACDONALD, JE ;

NORRIS, C .

SURFACE SCIENCE, 1989, 209 (1-2) :100-114

← 1 2 →