STUDIES ON SI(111)-SQUARE-ROOT X SQUARE-ROOT-3-BI AND -AG SURFACES BY X-RAY-DIFFRACTION UNDER NEARLY NORMAL INCIDENCE

被引：7

作者：

TAKAHASHI, T

NAKATANI, S

OKAMOTO, N

ISHIKAWA, T

KIKUTA, S

机构：

[1] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN

[2] UNIV TOKYO,FAC ENGN,TOKYO 113,JAPAN

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 07期

关键词：

D O I：

10.1063/1.1140721

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：2365 / 2368

页数：4

共 29 条

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