THE USE OF OPTICAL-EMISSION SPECTROSCOPY FOR PROCESS-CONTROL IN TRIODE ION PLATING WITH ZRN

被引:18
作者
SALMENOJA, K
KORHONEN, AS
机构
[1] Helsinki Univ of Technology, Espoo, Finl, Helsinki Univ of Technology, Espoo, Finl
基金
芬兰科学院;
关键词
ELECTROLESS PLATING - Zirconium Nitride - NITRIDES - Thin Films - PROCESS CONTROL - SPECTROSCOPY; EMISSION;
D O I
10.1016/0042-207X(86)90265-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In ion plating one effective way to enhance ionization is to use a negatively biased hot filament. The use of an electron emitting filament brings an extra variable to be taken into account in process control. However, in practice the most influential factor to be controlled is the evaporation rate. Simultaneous monitoring of the evaporation rate and a closed loop control of the evaporation source should therefore be the preferred method. There exist a great variety of different methods available for process control. These include mass spectroscopy (MS), absorption spectroscopy (AS) and optical emission spectroscopy (OES). The only way to control the coating process without disturbing the glow discharge is to use emission spectroscopy.
引用
收藏
页码:33 / 35
页数:3
相关论文
共 10 条
  • [1] OPTICAL-EMISSION FROM NEON OXYGEN RF SPUTTERING GLOW-DISCHARGES
    AITA, CR
    MARHIC, ME
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (01): : 69 - 73
  • [2] RANGES OF SOME LIGHT-IONS MEASURED BY (P, GAMMA) RESONANCE BROADENING
    ANTTILA, A
    BISTER, M
    FONTELL, A
    WINTERBON, KB
    [J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1977, 33 (01): : 13 - 19
  • [3] THE ANALYSIS AND AUTOMATIC-CONTROL OF A REACTIVE DC MAGNETRON SPUTTERING PROCESS
    ENJOUJI, K
    MURATA, K
    NISHIKAWA, S
    [J]. THIN SOLID FILMS, 1983, 108 (01) : 1 - 7
  • [4] OPTICAL SPECTROSCOPY FOR DIAGNOSTICS AND PROCESS-CONTROL DURING GLOW-DISCHARGE ETCHING AND SPUTTER DEPOSITION
    GREENE, JE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (05): : 1718 - 1729
  • [5] OPTICAL SPECTROSCOPY FOR GLOW-DISCHARGE SPUTTERING DIAGNOSTICS AND PROCESS-CONTROL
    GREENE, JE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (02): : 203 - 204
  • [6] HARSHBARGER WR, 1982, SOLID STATE TECHNOL, V25, P126
  • [7] Matsumoto O., 1983, Proceedings of the International Ion Engineering Congress. The 7th Symposium (1983 International) on Ion Sources and Ion Assisted Technology (ISIAT '83) and the 4th International Conference on Ion and Plasma Assisted Techniques (IPAT '83), P1379
  • [8] MATSUMOTO O, 1983, P INT ION ENG C ISIA, P1291
  • [9] SALMENOJA K, 1984, 6TH P INT C THIN FIL
  • [10] SALMENOJA K, 1985, APR P ICMC85 LOS ANG