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TUNNELING THROUGH A CONTROLLABLE VACUUM GAP
被引:1201
作者
:
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
GERBER, C
论文数:
0
引用数:
0
h-index:
0
GERBER, C
WEIBEL, E
论文数:
0
引用数:
0
h-index:
0
WEIBEL, E
机构
:
来源
:
APPLIED PHYSICS LETTERS
|
1982年
/ 40卷
/ 02期
关键词
:
D O I
:
10.1063/1.92999
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:178 / 180
页数:3
相关论文
共 15 条
[11]
OXIDIZED AMORPHOUS-SILICON SUPERCONDUCTING TUNNEL JUNCTION BARRIERS
[J].
RUDMAN, DA
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305
RUDMAN, DA
;
BEASLEY, MR
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305
BEASLEY, MR
.
APPLIED PHYSICS LETTERS,
1980,
36
(12)
:1010
-1013
[12]
Solymar L., 1972, SUPERCONDUCTIVE TUNN
[13]
THERMAL DRIVE APPARATUS FOR DIRECT VACUUM TUNNELING EXPERIMENTS
[J].
THOMPSON, WA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
THOMPSON, WA
;
HANRAHAN, SF
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
HANRAHAN, SF
.
REVIEW OF SCIENTIFIC INSTRUMENTS,
1976,
47
(10)
:1303
-1304
[14]
TOPOGRAFINER - INSTRUMENT FOR MEASURING SURFACE MICROTOPOGRAPHY
[J].
YOUNG, R
论文数:
0
引用数:
0
h-index:
0
YOUNG, R
;
WARD, J
论文数:
0
引用数:
0
h-index:
0
WARD, J
;
SCIRE, F
论文数:
0
引用数:
0
h-index:
0
SCIRE, F
.
REVIEW OF SCIENTIFIC INSTRUMENTS,
1972,
43
(07)
:999
-&
[15]
[No title captured]
←
1
2
→
共 15 条
[11]
OXIDIZED AMORPHOUS-SILICON SUPERCONDUCTING TUNNEL JUNCTION BARRIERS
[J].
RUDMAN, DA
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305
RUDMAN, DA
;
BEASLEY, MR
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305
BEASLEY, MR
.
APPLIED PHYSICS LETTERS,
1980,
36
(12)
:1010
-1013
[12]
Solymar L., 1972, SUPERCONDUCTIVE TUNN
[13]
THERMAL DRIVE APPARATUS FOR DIRECT VACUUM TUNNELING EXPERIMENTS
[J].
THOMPSON, WA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
THOMPSON, WA
;
HANRAHAN, SF
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
HANRAHAN, SF
.
REVIEW OF SCIENTIFIC INSTRUMENTS,
1976,
47
(10)
:1303
-1304
[14]
TOPOGRAFINER - INSTRUMENT FOR MEASURING SURFACE MICROTOPOGRAPHY
[J].
YOUNG, R
论文数:
0
引用数:
0
h-index:
0
YOUNG, R
;
WARD, J
论文数:
0
引用数:
0
h-index:
0
WARD, J
;
SCIRE, F
论文数:
0
引用数:
0
h-index:
0
SCIRE, F
.
REVIEW OF SCIENTIFIC INSTRUMENTS,
1972,
43
(07)
:999
-&
[15]
[No title captured]
←
1
2
→