IDENTIFICATION OF CHALCOGEN POINT-DEFECT SITES IN SILICON BY TOTAL-ENERGY CALCULATIONS

被引：41

作者：

BEELER, F ^{[1
]}

SCHEFFLER, M ^{[1
]}

JEPSEN, O ^{[1
]}

GUNNARSSON, O ^{[1
]}

机构：

[1] PHYS TECH BUNDESANSTALT,D-3300 BRUNSWICK,FED REP GER

来源：

PHYSICAL REVIEW LETTERS | 1985年 / 54卷 / 23期

关键词：

D O I：

10.1103/PhysRevLett.54.2525

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：2525 / 2528

页数：4

共 28 条

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