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SOME PROPERTIES OF VAPOR DEPOSITED SILICON NITRIDE FILMS USING SIH4-NH3-H2 SYSTEM
被引:116
作者
:
BEAN, KE
论文数:
0
引用数:
0
h-index:
0
BEAN, KE
GLEIM, PS
论文数:
0
引用数:
0
h-index:
0
GLEIM, PS
YEAKLEY, RL
论文数:
0
引用数:
0
h-index:
0
YEAKLEY, RL
RUNYAN, WR
论文数:
0
引用数:
0
h-index:
0
RUNYAN, WR
机构
:
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1967年
/ 114卷
/ 07期
关键词
:
D O I
:
10.1149/1.2426719
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:733 / &
相关论文
共 17 条
[1]
DETERMINATION OF PROPERTIES OF FILMS ON SILICON BY METHOD OF ELLIPSOMETRY
ARCHER, RJ
论文数:
0
引用数:
0
h-index:
0
ARCHER, RJ
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1962,
52
(09)
: 970
-
&
[2]
PYROLYTIC DEPOSITION OF SILICON DIOXIDE FOR 600-DEGREES-C THIN FILM CAPACITORS
BARNES, CR
论文数:
0
引用数:
0
h-index:
0
BARNES, CR
GEESNER, CR
论文数:
0
引用数:
0
h-index:
0
GEESNER, CR
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1963,
110
(05)
: 361
-
362
[3]
SILICON NITRIDE THIN FILM DIELECTRIC
BARNES, CR
论文数:
0
引用数:
0
h-index:
0
BARNES, CR
GEESNER, CR
论文数:
0
引用数:
0
h-index:
0
GEESNER, CR
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1960,
107
(02)
: 98
-
100
[4]
BEAN K, 1963, J ELECTROCHEM SOC, V110, pC265
[5]
BEREZHNOI AS, 1960, SILICON BINARY SYSTE
[6]
BROWN GE, TO BE PUBLISHED
[7]
IN SITU ETCHING OF SILICON SUBSTRATES PRIOR TO EPITAXIAL GROWTH
CHU, TL
论文数:
0
引用数:
0
h-index:
0
CHU, TL
GRUBER, GA
论文数:
0
引用数:
0
h-index:
0
GRUBER, GA
STICKLER, R
论文数:
0
引用数:
0
h-index:
0
STICKLER, R
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1966,
113
(2P1)
: 156
-
&
[8]
PREPARATION AND PROPERTIES OF PYROLYTIC SILICON NITRIDE
DOO, VY
论文数:
0
引用数:
0
h-index:
0
DOO, VY
NICHOLS, DR
论文数:
0
引用数:
0
h-index:
0
NICHOLS, DR
SILVEY, GA
论文数:
0
引用数:
0
h-index:
0
SILVEY, GA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1966,
113
(12)
: 1279
-
&
[9]
DOO VY, 1966, OCT EL SOC M PHIL
[10]
HU SM, 1965, OCT EL SOC M BUFF
←
1
2
→
共 17 条
[1]
DETERMINATION OF PROPERTIES OF FILMS ON SILICON BY METHOD OF ELLIPSOMETRY
ARCHER, RJ
论文数:
0
引用数:
0
h-index:
0
ARCHER, RJ
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1962,
52
(09)
: 970
-
&
[2]
PYROLYTIC DEPOSITION OF SILICON DIOXIDE FOR 600-DEGREES-C THIN FILM CAPACITORS
BARNES, CR
论文数:
0
引用数:
0
h-index:
0
BARNES, CR
GEESNER, CR
论文数:
0
引用数:
0
h-index:
0
GEESNER, CR
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1963,
110
(05)
: 361
-
362
[3]
SILICON NITRIDE THIN FILM DIELECTRIC
BARNES, CR
论文数:
0
引用数:
0
h-index:
0
BARNES, CR
GEESNER, CR
论文数:
0
引用数:
0
h-index:
0
GEESNER, CR
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1960,
107
(02)
: 98
-
100
[4]
BEAN K, 1963, J ELECTROCHEM SOC, V110, pC265
[5]
BEREZHNOI AS, 1960, SILICON BINARY SYSTE
[6]
BROWN GE, TO BE PUBLISHED
[7]
IN SITU ETCHING OF SILICON SUBSTRATES PRIOR TO EPITAXIAL GROWTH
CHU, TL
论文数:
0
引用数:
0
h-index:
0
CHU, TL
GRUBER, GA
论文数:
0
引用数:
0
h-index:
0
GRUBER, GA
STICKLER, R
论文数:
0
引用数:
0
h-index:
0
STICKLER, R
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1966,
113
(2P1)
: 156
-
&
[8]
PREPARATION AND PROPERTIES OF PYROLYTIC SILICON NITRIDE
DOO, VY
论文数:
0
引用数:
0
h-index:
0
DOO, VY
NICHOLS, DR
论文数:
0
引用数:
0
h-index:
0
NICHOLS, DR
SILVEY, GA
论文数:
0
引用数:
0
h-index:
0
SILVEY, GA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1966,
113
(12)
: 1279
-
&
[9]
DOO VY, 1966, OCT EL SOC M PHIL
[10]
HU SM, 1965, OCT EL SOC M BUFF
←
1
2
→