NORMAL PHOTO-ELECTRON DIFFRACTION STUDIES OF SELENIUM AND SULFUR OVERLAYERS ON NI(011) AND NI(111)

被引：42

作者：

ROSENBLATT, DH

KEVAN, SD

TOBIN, JG

DAVIS, RF

MASON, MG

DENLEY, DR

SHIRLEY, DA

HUANG, Y

TONG, SY

机构：

[1] UNIV CALIF BERKELEY,DEPT CHEM,BERKELEY,CA 94720

[2] UNIV WISCONSIN,DEPT PHYS,MILWAUKEE,WI 53201

[3] UNIV WISCONSIN,SURFACE STUDIES LAB,MILWAUKEE,WI 53201

来源：

PHYSICAL REVIEW B | 1982年 / 26卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.26.1812

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1812 / 1818

页数：7

共 21 条

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[10] TEMPERATURE-DEPENDENCE OF NORMAL-EMISSION PHOTOELECTRON DIFFRACTION AND ANALOGIES WITH EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE [J].

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