AN INTEGRATED APPROACH TO STATISTICAL MODELING OF BIPOLAR-DEVICES FOR LSI

被引：1

作者：

FOX, PE ^{[1
]}

机构：

[1] IBM CORP,DIV GEN TECHNOL,HOPEWELL JUNCTION,NY 12533

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1984年 / 19卷 / 05期

关键词：

D O I：

10.1109/JSSC.1984.1052219

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：765 / 772

页数：8

共 14 条

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[J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (05) : 218 - 227
[3] DESIGN OF ACP RESISTOR-COUPLED SWITCHING CIRCUITS
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[4] EXPERIMENTAL-STUDY OF GUMMEL-POON MODEL PARAMETER CORRELATIONS FOR BIPOLAR JUNCTION TRANSISTORS
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MCCALLA, WJ
[J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1977, 12 (05) : 552 - 559
[5] FOX PE, 1972, FEB IEEE INT SOL STA, P66
[6] A DISTRIBUTED MODEL OF JUNCTION TRANSISTOR AND ITS APPLICATION IN PREDICTION OF EMITTER-BASE DIODE CHARACTERISTIC BASE IMPEDANCE AND PULSE RESPONSE OF DEVICE
GHOSH, HN
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1965, ED12 (10) : 513 - &
[7] GRAY PE, 1964, PHYSICAL ELECTRONICS, V2
[8] EVALUATION OF ELECTRON INJECTION CURRENT-DENSITY IN P-LAYERS FOR INJECTION MODELING OF I2L
HEIMEIER, HH
BERGER, HH
[J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1977, 12 (02) : 205 - 206
[9] STATISTICAL APPROACH TO DESIGN OF DIFFUSED JUNCTION TRANSISTORS
KENNEDY, DP
OBRIEN, RR
MURLEY, PC
[J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1964, 8 (05) : 482 - &
[10] CHARACTERIZATION AND MODELING FOR STATISTICAL DESIGN
LOGAN, J
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1971, 50 (04): : 1105 - +

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