CURRENT-VOLTAGE CHARACTERISTICS OF SILICON METALLIC-SILICIDE INTERFACES

被引：14

作者：

PELLEGRINI, B ^{[1
]}

机构：

[1] UNIV PISA, CNR, CENTRO STUDIO METODI & DISPOSITIVI RADIOTRASMISSIO, VIA DIOTISALVI 2, 56100 PISA, ITALY

来源：

SOLID-STATE ELECTRONICS | 1975年 / 18卷 / 05期

关键词：

D O I：

10.1016/0038-1101(75)90043-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：417 / 426

页数：10

共 27 条

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