LASER-INDUCED PERIODIC SURFACE-STRUCTURE .3. FLUENCE REGIMES, THE ROLE OF FEEDBACK, AND DETAILS OF THE INDUCED TOPOGRAPHY IN GERMANIUM

被引：297

作者：

YOUNG, JF ^{[1
]}

SIPE, JE ^{[1
]}

VANDRIEL, HM ^{[1
]}

机构：

[1] UNIV TORONTO,ERINDALE COLL,TORONTO M5S 1A7,ONTARIO,CANADA

来源：

PHYSICAL REVIEW B | 1984年 / 30卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.30.2001

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2001 / 2015

页数：15

共 41 条

[1] OPTICAL MEASUREMENT OF FILM GROWTH ON SILICON AND GERMANIUM SURFACES IN ROOM AIR [J].

ARCHER, RJ .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1957, 104 (10) :619-622

[2] SEGREGATION EFFECTS IN CU-IMPLANTED SI AFTER LASER-PULSE MELTING [J].

BAERI, P ;

CAMPISANO, SU ;

FOTI, G ;

RIMINI, E .

PHYSICAL REVIEW LETTERS, 1978, 41 (18) :1246-1249

[3] MENISCUS IN CZOCHRALSKI GROWTH [J].

BARDSLEY, W ;

FRANK, FC ;

GREEN, GW ;

HURLE, DTJ .

JOURNAL OF CRYSTAL GROWTH, 1974, 23 (04) :341-344

[4] SEMICONDUCTOR SURFACE DAMAGE PRODUCED BY RUBY LASERS [J].

BIRNBAUM, M .

JOURNAL OF APPLIED PHYSICS, 1965, 36 (11) :3688-&

[5] STIMULATED SURFACE-PLASMA-WAVE SCATTERING AND GROWTH OF A PERIODIC STRUCTURE IN LASER-PHOTODEPOSITED METAL-FILMS [J].

BRUECK, SRJ ;

EHRLICH, DJ .

PHYSICAL REVIEW LETTERS, 1982, 48 (24) :1678-1681

[6] TIME-RESOLVED MEASUREMENTS OF STIMULATED SURFACE POLARITON WAVE SCATTERING AND GRATING FORMATION IN PULSED-LASER-ANNEALED GERMANIUM [J].

EHRLICH, DJ ;

BRUECK, SRJ ;

TSAO, JY .

APPLIED PHYSICS LETTERS, 1982, 41 (07) :630-633

[7] LASER MICROPHOTOCHEMISTRY FOR USE IN SOLID-STATE ELECTRONICS [J].

EHRLICH, DJ ;

OSGOOD, RM ;

DEUTSCH, TF .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1980, 16 (11) :1233-1243

[8] SURFACE RIPPLES ON SILICON AND GALLIUM-ARSENIDE UNDER PICOSECOND LASER ILLUMINATION [J].

FAUCHET, PM ;

SIEGMAN, AE .

APPLIED PHYSICS LETTERS, 1982, 40 (09) :824-826

[9]

Glazov V. M., 1969, LIQUID SEMICONDUCTOR

[10]

GRAY DE, 1972, AM I PHYSICS HDB

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