OPTICAL AND SURFACE-ANALYTICAL METHODS FOR THE CHARACTERIZATION OF ULTRATHIN ORGANIC FILMS

被引：18

作者：

BUBECK, C

HOLTKAMP, D

机构：

[1] MAX PLANCK INST POLYMER RES,W-6500 MAINZ,GERMANY

[2] BAYER AG,ZENT FORSCH,W-5090 LEVERKUSEN,GERMANY

来源：

ADVANCED MATERIALS | 1991年 / 3卷 / 01期

关键词：

SIMS; INFRARED SPECTROSCOPY; RAMAN SPECTROSCOPY; NONDESTRUCTIVE ANALYSIS;

D O I：

10.1002/adma.19910030107

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Review: The elemental and molecular composition of polymeric organic films can be studied using techniques such as secondary ion mass spectrometry (SIMS), infrared and Raman spectroscopy and X‐ray photoelectron spectroscopy (XPS). These non‐destructive methods also reveal information on depth profiles, molecular organization, and interface effects. The techniques and improvemetns made specifically for the study of monolayers and LB films using vibrational spectroscopy are described. Copyright © 1991 Verlag GmbH & Co. KGaA, Weinheim

引用

页码：32 / 38

页数：7

共 47 条

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[47] [No title captured]

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