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CHARACTERIZATION OF INTERFACE STATES IN THIN-FILMS OF THERMALLY GROWN SIO2

被引：3
作者：
CAMPABADAL, F
AYMERICHHUMET, X
SERRAMESTRES, F
机构：
来源：
VACUUM | 1984年 / 34卷 / 10-1期
关键词：
D O I：
10.1016/0042-207X(84)90187-8
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：1005 / 1007
页数：3
相关论文
共 6 条
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