PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY IN HIGH-RESISTIVITY BULK MATERIAL .3. SCANNING-PICTS SYSTEM FOR IMAGING SPATIAL DISTRIBUTIONS OF DEEP-TRAPS IN SEMI-INSULATING GAAS WAFER

被引：18

作者：

YOSHIE, O

KAMIHARA, M

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1985年 / 24卷 / 04期

关键词：

D O I：

10.1143/JJAP.24.431

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：431 / 440

页数：10

共 28 条

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