FORMULAS FOR USING WAVE PLATES IN ELLIPSOMETRY

[31] PASSAGLIA E, 1964, 256 NAT BUR STAND MI

[32] ERROR IN DIELECTRIC-FILM ELLIPSOMETER DETERMINATIONS DUE TO NEGLECT OF FILM ABSORPTION [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (07) : 845 - &

[33] ANALYSIS OF ELLIPTICALLY POLARIZED LIGHT [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (09) : 892 - 894

[34] RAMACHANDRAN GN, 1961, ENCYCL PHYS, V25, P34

[35] NEW APPROACH TO MACCULLAGH METHOD FOR ANALYZING ELLIPTICAL LIGHT [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1966, 56 (02) : 198 - &

[36] RICHARTZ M, 1965, Z INSTRUMENTENKD, V73, P205

[37] IMPROVED METHOD TO MEASURE THE THICKNESS OF THIN FILMS WITH A PHOTOELECTRIC ELLIPSOMETER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1957, 28 (04) : 283 - 285

[38] OPTICAL PROPERTIES OF SURFACE FILMS [J]. ANNALS OF THE NEW YORK ACADEMY OF SCIENCES, 1951, 53 (05) : 1054 - 1063

[39] OPTICAL MEASUREMENTS OF SURFACE FILMS .1. [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1948, 19 (12) : 839 - 841

[40] THE ELLIPSOMETER, AN APPARATUS TO MEASURE THICKNESSES OF THIN SURFACE FILMS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1945, 16 (02) : 26 - 30

[31] PASSAGLIA E, 1964, 256 NAT BUR STAND MI

[32] ERROR IN DIELECTRIC-FILM ELLIPSOMETER DETERMINATIONS DUE TO NEGLECT OF FILM ABSORPTION [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (07) : 845 - &

[33] ANALYSIS OF ELLIPTICALLY POLARIZED LIGHT [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (09) : 892 - 894

[34] RAMACHANDRAN GN, 1961, ENCYCL PHYS, V25, P34

[35] NEW APPROACH TO MACCULLAGH METHOD FOR ANALYZING ELLIPTICAL LIGHT [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1966, 56 (02) : 198 - &

[36] RICHARTZ M, 1965, Z INSTRUMENTENKD, V73, P205

[37] IMPROVED METHOD TO MEASURE THE THICKNESS OF THIN FILMS WITH A PHOTOELECTRIC ELLIPSOMETER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1957, 28 (04) : 283 - 285

[38] OPTICAL PROPERTIES OF SURFACE FILMS [J]. ANNALS OF THE NEW YORK ACADEMY OF SCIENCES, 1951, 53 (05) : 1054 - 1063

[39] OPTICAL MEASUREMENTS OF SURFACE FILMS .1. [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1948, 19 (12) : 839 - 841

[40] THE ELLIPSOMETER, AN APPARATUS TO MEASURE THICKNESSES OF THIN SURFACE FILMS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1945, 16 (02) : 26 - 30