DETERMINATION OF SI-METAL WORK FUNCTION DIFFERENCES BY MOS CAPACITANCE TECHNIQUE

被引：45

作者：

KAR, S ^{[1
]}

机构：

[1] FRAUNHOFER GESELL,INST ANGEW FESTKOERPE PHYS,ECKER STR 4,7800 FREIBURG,FED REP GER

来源：

SOLID-STATE ELECTRONICS | 1975年 / 18卷 / 02期

关键词：

D O I：

10.1016/0038-1101(75)90100-8

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：169 / 181

页数：13

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