CHARACTERIZATION OF MICROSTRUCTURE AND INTERFACES IN TIC-TIB2 COATINGS

TiC and TiB2 single-layer coatings and TiC-TiB2 multilayer coatings including 10, 100 and 1000 individual layers with a total thickness of 5-mu-m were prepared by magnetron sputtering. The mechanical properties and X-ray diffraction patterns of the multilayer coatings show a clear dependence on the number of phase transitions. In contrast to former investigations with Auger electron spectroscopy, no interface zones between TiC and TiB2 layers could be seen in the transmission electron microscope (TEM). TEM examinations of single-layer coatings indicate a change of texture with distance from the substrate-coating interface. In multilayer coatings a similar change of texture can be found resulting in additional interfaces and could thus be the reason for the change in properties and X-ray diffraction patterns.