EFFECTS OF SPUTTERING ON THE SURFACE OF GRAPHITE

被引：7

作者：

NAKAGIRI, N

KOGA, Y

MIYAZAKI, Y

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01385.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：245 / 250

页数：6

共 8 条

[1] TUNNELING THROUGH A CONTROLLABLE VACUUM GAP [J].

BINNIG, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

APPLIED PHYSICS LETTERS, 1982, 40 (02) :178-180

[2]

BINNIG G, 1982, HELV PHYS ACTA, V55, P726

[3] SCANNING TUNNELING MICROSCOPY [J].

BINNIG, G ;

ROHRER, H .

SURFACE SCIENCE, 1983, 126 (1-3) :236-244

[4] SURFACE-MORPHOLOGY OF OXIDIZED AND ION-ETCHED SILICON BY SCANNING TUNNELING MICROSCOPY [J].

FEENSTRA, RM ;

OEHRLEIN, GS .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (04) :1136-1137

[5] SURFACE-MORPHOLOGY OF GAAS(110) BY SCANNING TUNNELING MICROSCOPY [J].

FEENSTRA, RM ;

FEIN, AP .

PHYSICAL REVIEW B, 1985, 32 (02) :1394-1396

[6] SURFACE-ROUGHNESS STANDARDS, OBTAINED WITH THE SCANNING TUNNELING MICROSCOPE OPERATED AT ATMOSPHERIC AIR-PRESSURE [J].

GARCIA, N ;

BARO, AM ;

MIRANDA, R ;

ROHRER, H ;

GERBER, C ;

CANTU, RG ;

PENA, JL .

METROLOGIA, 1985, 21 (03) :135-138

[7] SCANNING TUNNELING MICROSCOPE COMBINED WITH SCANNING ELECTRON-MICROSCOPE [J].

ICHINOKAWA, T ;

MIYAZAKI, Y ;

KOGA, Y .

ULTRAMICROSCOPY, 1987, 23 (01) :115-118

[8] STM STUDY OF THE EFFECTS OF ETCHING ON THE SURFACE OF KISH-GRAPHITE [J].

KOGA, Y ;

MIYAZAKI, Y ;

NAKAGIRI, N .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1988, 27 (06) :L976-L978

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