THERMAL-STRESS IN CVD PSG AND SIO2-FILMS ON SILICON SUBSTRATES

被引:28
作者
SHIMBO, M
MATSUO, T
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D O I
10.1149/1.2119640
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
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页码:135 / 138
页数:4
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