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PREDICTING CMOS INVERTER RESPONSE IN NUCLEAR AND SPACE ENVIRONMENTS
被引:77
作者
:
WINOKUR, PS
论文数:
0
引用数:
0
h-index:
0
WINOKUR, PS
KERRIS, KG
论文数:
0
引用数:
0
h-index:
0
KERRIS, KG
HARPER, L
论文数:
0
引用数:
0
h-index:
0
HARPER, L
机构
:
来源
:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
|
1983年
/ 30卷
/ 06期
关键词
:
D O I
:
10.1109/TNS.1983.4333132
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:4326 / 4332
页数:7
相关论文
共 12 条
[1]
BROWN DB, 1982, IEEE T NUCL SCI, V28, P1996
[2]
EXPOSURE-DOSE-RATE-DEPENDENCE FOR A CMOS-SOS MEMORY
BRUCKER, GJ
论文数:
0
引用数:
0
h-index:
0
BRUCKER, GJ
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1981,
28
(06)
: 4056
-
4059
[3]
BUCK J, 1980, GOVT MICROCIRCUIT AP, V3, P320
[4]
CMOS HARDNESS PREDICTION FOR LOW-DOSE-RATE ENVIRONMENTS
DERBENWICK, GF
论文数:
0
引用数:
0
h-index:
0
DERBENWICK, GF
SANDER, HH
论文数:
0
引用数:
0
h-index:
0
SANDER, HH
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1977,
24
(06)
: 2244
-
2247
[5]
ROOM-TEMPERATURE ANNEALING OF IONIZATION-INDUCED DAMAGE IN CMOS CIRCUITS
HABING, DH
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
HABING, DH
SHAFER, BD
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
SHAFER, BD
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1973,
NS20
(06)
: 307
-
314
[6]
LOWE LF, 1982, IEEE T NUCL SCI, V28, P1992
[7]
A REVIEW OF DOSE-RATE DEPENDENT EFFECTS OF TOTAL IONIZING DOSE (TID) IRRADIATIONS
NICHOLS, DK
论文数:
0
引用数:
0
h-index:
0
NICHOLS, DK
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1980,
27
(02)
: 1016
-
1024
[8]
FIELD-DEPENDENT AND TIME-DEPENDENT RADIATION EFFECTS AT SIO2-SI INTERFACE OF HARDENED MOS CAPACITORS
WINOKUR, PS
论文数:
0
引用数:
0
h-index:
0
WINOKUR, PS
BOESCH, HE
论文数:
0
引用数:
0
h-index:
0
BOESCH, HE
MCGARRITY, JM
论文数:
0
引用数:
0
h-index:
0
MCGARRITY, JM
MCLEAN, FB
论文数:
0
引用数:
0
h-index:
0
MCLEAN, FB
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1977,
24
(06)
: 2113
-
2118
[9]
INTERFACE-STATE GENERATION IN RADIATION-HARD OXIDES
WINOKUR, PS
论文数:
0
引用数:
0
h-index:
0
WINOKUR, PS
BOESCH, HE
论文数:
0
引用数:
0
h-index:
0
BOESCH, HE
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1980,
27
(06)
: 1647
-
1650
[10]
WINOKUR PS, 1982, IEEE T NUCL SCI, V28, P2102
←
1
2
→
共 12 条
[1]
BROWN DB, 1982, IEEE T NUCL SCI, V28, P1996
[2]
EXPOSURE-DOSE-RATE-DEPENDENCE FOR A CMOS-SOS MEMORY
BRUCKER, GJ
论文数:
0
引用数:
0
h-index:
0
BRUCKER, GJ
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1981,
28
(06)
: 4056
-
4059
[3]
BUCK J, 1980, GOVT MICROCIRCUIT AP, V3, P320
[4]
CMOS HARDNESS PREDICTION FOR LOW-DOSE-RATE ENVIRONMENTS
DERBENWICK, GF
论文数:
0
引用数:
0
h-index:
0
DERBENWICK, GF
SANDER, HH
论文数:
0
引用数:
0
h-index:
0
SANDER, HH
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1977,
24
(06)
: 2244
-
2247
[5]
ROOM-TEMPERATURE ANNEALING OF IONIZATION-INDUCED DAMAGE IN CMOS CIRCUITS
HABING, DH
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
HABING, DH
SHAFER, BD
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
SHAFER, BD
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1973,
NS20
(06)
: 307
-
314
[6]
LOWE LF, 1982, IEEE T NUCL SCI, V28, P1992
[7]
A REVIEW OF DOSE-RATE DEPENDENT EFFECTS OF TOTAL IONIZING DOSE (TID) IRRADIATIONS
NICHOLS, DK
论文数:
0
引用数:
0
h-index:
0
NICHOLS, DK
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1980,
27
(02)
: 1016
-
1024
[8]
FIELD-DEPENDENT AND TIME-DEPENDENT RADIATION EFFECTS AT SIO2-SI INTERFACE OF HARDENED MOS CAPACITORS
WINOKUR, PS
论文数:
0
引用数:
0
h-index:
0
WINOKUR, PS
BOESCH, HE
论文数:
0
引用数:
0
h-index:
0
BOESCH, HE
MCGARRITY, JM
论文数:
0
引用数:
0
h-index:
0
MCGARRITY, JM
MCLEAN, FB
论文数:
0
引用数:
0
h-index:
0
MCLEAN, FB
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1977,
24
(06)
: 2113
-
2118
[9]
INTERFACE-STATE GENERATION IN RADIATION-HARD OXIDES
WINOKUR, PS
论文数:
0
引用数:
0
h-index:
0
WINOKUR, PS
BOESCH, HE
论文数:
0
引用数:
0
h-index:
0
BOESCH, HE
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1980,
27
(06)
: 1647
-
1650
[10]
WINOKUR PS, 1982, IEEE T NUCL SCI, V28, P2102
←
1
2
→