DIGITAL IMAGE RECORDING AND PROCESSING USING AN APPLE-II MICROCOMPUTER

[1] EXAMPLES OF IMAGE-PROCESSING USING A COMPUTER-CONTROLLED SEM [J]. SCANNING, 1983, 5 (03) : 129 - 136

[2] TESTING OF DETECTOR STRATEGIES IN SCANNING ELECTRON-MICROSCOPY BY ISODENSITIES [J]. JOURNAL OF MICROSCOPY-OXFORD, 1984, 134 (APR): : 1 - 12

[3] DIGITAL IMAGE-PROCESSING OF MULTIPLE DETECTOR SIGNALS IN SCANNING ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1985, 16 (02) : 161 - 173

[4] REIMER L, 1982, ELECTRON MICROS, V2, P543

[5] REIMER L, 1982, PHILIPS ELECTR OPT B, V118

[6] Reimer L., 1982, ELECTRON BEAM INTERA, P299

[7] DIGITAL BEAM CONTROL FOR FAST DIFFERENTIAL VOLTAGE CONTRAST [J]. SCANNING, 1984, 6 (03) : 122 - 127

[8] ONLINE DIGITAL-COMPUTER TECHNIQUES IN ELECTRON-MICROSCOPY - GENERAL INTRODUCTION [J]. JOURNAL OF MICROSCOPY-OXFORD, 1982, 127 (JUL): : 3 - 16

[9] AUTOMATIC FOCUSING AND STIGMATING SYSTEM FOR THE SEM [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1979, 12 (01): : 35 - 38

[10] VOLBERT B, 1982, ELECTRON MICROS, V1, P233

[1] EXAMPLES OF IMAGE-PROCESSING USING A COMPUTER-CONTROLLED SEM [J]. SCANNING, 1983, 5 (03) : 129 - 136

[2] TESTING OF DETECTOR STRATEGIES IN SCANNING ELECTRON-MICROSCOPY BY ISODENSITIES [J]. JOURNAL OF MICROSCOPY-OXFORD, 1984, 134 (APR): : 1 - 12

[3] DIGITAL IMAGE-PROCESSING OF MULTIPLE DETECTOR SIGNALS IN SCANNING ELECTRON-MICROSCOPY [J]. ULTRAMICROSCOPY, 1985, 16 (02) : 161 - 173

[4] REIMER L, 1982, ELECTRON MICROS, V2, P543

[5] REIMER L, 1982, PHILIPS ELECTR OPT B, V118

[6] Reimer L., 1982, ELECTRON BEAM INTERA, P299

[7] DIGITAL BEAM CONTROL FOR FAST DIFFERENTIAL VOLTAGE CONTRAST [J]. SCANNING, 1984, 6 (03) : 122 - 127

[8] ONLINE DIGITAL-COMPUTER TECHNIQUES IN ELECTRON-MICROSCOPY - GENERAL INTRODUCTION [J]. JOURNAL OF MICROSCOPY-OXFORD, 1982, 127 (JUL): : 3 - 16

[9] AUTOMATIC FOCUSING AND STIGMATING SYSTEM FOR THE SEM [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1979, 12 (01): : 35 - 38

[10] VOLBERT B, 1982, ELECTRON MICROS, V1, P233