THE GENERATION OF 3-DIMENSIONAL BIPOLAR-TRANSISTOR MODELS FOR CIRCUIT ANALYSIS

被引：14

作者：

CHANG, FY ^{[1
]}

WAGNER, LF ^{[1
]}

机构：

[1] IBM CORP, E FISHKILL FACIL, DEPT BIPOLAR DEVICE DESIGN & MODELING, HOPEWELL JUNCTION, NY 12533 USA

来源：

IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1985年 / 29卷 / 03期

关键词：

ADVANCED STATISTICAL ANALYSIS PROGRAM (ASTAP) - MODEL GENERATION PROGRAM (MGP) - TWO-DIMENSIONAL BIPOLAR NUMERICAL DEVICE-ANALYSIS PROGRAM;

D O I：

10.1147/rd.293.0252

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：252 / 262

页数：11

共 5 条

[1] LARGE-SIGNAL BEHAVIOR OF JUNCTION TRANSISTORS [J].

EBERS, JJ ;

MOLL, JL .

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1954, 42 (12) :1761-1772

[2] TWO-DIMENSIONAL DEVICE SIMULATION PROGRAM - 2DP [J].

GAUR, SP ;

HABITZ, PA ;

PARK, YJ ;

COOK, RK ;

HUANG, YS ;

WAGNER, LF .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1985, 29 (03) :242-251

[3]

KIRK CT, 1962, IRE T ELECTRON DEV, V9, P164, DOI DOI 10.1109/T-ED.1962.14965

[4] ADVANCED BIPOLAR-TRANSISTOR MODELING - PROCESS AND DEVICE SIMULATION TOOLS FOR TODAYS TECHNOLOGY [J].

KNEPPER, RW ;

GAUR, SP ;

CHANG, FY ;

SRINIVASAN, GR .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1985, 29 (03) :218-228

[5] TWO-DIMENSIONAL PROCESS MODELING - A DESCRIPTION OF THE SAFEPRO PROGRAM [J].

OBRIEN, RR ;

HSIEH, CM ;

MOORE, JS ;

LEVER, RF ;

MURLEY, PC ;

BRANNON, KW ;

SRINIVASAN, GR ;

KNEPPER, RW .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1985, 29 (03) :229-241

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