INVESTIGATION OF DC PLANAR-MAGNETRON-SPUTTERED PALLADIUM FILMS BY SPECTROSCOPIC ELLIPSOMETRY

[1] MULTIPLE DETERMINATION OF THE OPTICAL-CONSTANTS OF THIN-FILM COATING MATERIALS - A RH SEQUEL [J]. APPLIED OPTICS, 1986, 25 (08): : 1299 - 1310

[2] HIGH PRECISION SCANNING ELLIPSOMETER [J]. APPLIED OPTICS, 1975, 14 (01): : 220 - 228

[3] INVESTIGATION OF EFFECTIVE-MEDIUM MODELS OF MICROSCOPIC SURFACE-ROUGHNESS BY SPECTROSCOPIC ELLIPSOMETRY [J]. PHYSICAL REVIEW B, 1979, 20 (08): : 3292 - 3302

[4] ANALYSIS OF CERMET FILMS WITH LARGE METAL PACKING FRACTIONS [J]. PHYSICAL REVIEW B, 1986, 33 (02): : 677 - 682

[5] METHODS FOR DRIFT STABILIZATION AND PHOTOMULTIPLIER LINEARIZATION FOR PHOTOMETRIC ELLIPSOMETERS AND POLARIMETERS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1978, 49 (03) : 291 - 297

[6] ASPNES DE, 1981, SPIE P, V276, P188

[7] BLANCO JR, 1985, APPL OPTICS, V24, P3773, DOI 10.1364/AO.24.003773

[8] BLANCO JR, 1986, MULTIPLE SCATTERING

[9] Calculation of various physics constants in heterogenous substances I Dielectricity constants and conductivity of mixed bodies from isotropic substances [J]. ANNALEN DER PHYSIK, 1935, 24 (07) : 636 - 664

[10] EFFECT OF ENERGETIC NEUTRALIZED NOBLE-GAS IONS ON THE STRUCTURE OF ION-BEAM SPUTTERED THIN METAL-FILMS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (01): : 44 - 51

[1] MULTIPLE DETERMINATION OF THE OPTICAL-CONSTANTS OF THIN-FILM COATING MATERIALS - A RH SEQUEL [J]. APPLIED OPTICS, 1986, 25 (08): : 1299 - 1310

[2] HIGH PRECISION SCANNING ELLIPSOMETER [J]. APPLIED OPTICS, 1975, 14 (01): : 220 - 228

[3] INVESTIGATION OF EFFECTIVE-MEDIUM MODELS OF MICROSCOPIC SURFACE-ROUGHNESS BY SPECTROSCOPIC ELLIPSOMETRY [J]. PHYSICAL REVIEW B, 1979, 20 (08): : 3292 - 3302

[4] ANALYSIS OF CERMET FILMS WITH LARGE METAL PACKING FRACTIONS [J]. PHYSICAL REVIEW B, 1986, 33 (02): : 677 - 682

[5] METHODS FOR DRIFT STABILIZATION AND PHOTOMULTIPLIER LINEARIZATION FOR PHOTOMETRIC ELLIPSOMETERS AND POLARIMETERS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1978, 49 (03) : 291 - 297

[6] ASPNES DE, 1981, SPIE P, V276, P188

[7] BLANCO JR, 1985, APPL OPTICS, V24, P3773, DOI 10.1364/AO.24.003773

[8] BLANCO JR, 1986, MULTIPLE SCATTERING

[9] Calculation of various physics constants in heterogenous substances I Dielectricity constants and conductivity of mixed bodies from isotropic substances [J]. ANNALEN DER PHYSIK, 1935, 24 (07) : 636 - 664

[10] EFFECT OF ENERGETIC NEUTRALIZED NOBLE-GAS IONS ON THE STRUCTURE OF ION-BEAM SPUTTERED THIN METAL-FILMS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (01): : 44 - 51