CONCENTRATION PROFILES FOR IRREGULAR SURFACES FROM X-RAY PHOTOELECTRON ANGULAR-DISTRIBUTIONS

被引：38

作者：

BAIRD, RJ

FADLEY, CS

KAWAMOTO, SK

MEHTA, M

ALVAREZ, R

SILVA, JA

机构：

[1] UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822

[2] UNIV HAWAII,DEPT AGRON & SOIL SCI,HONOLULU,HI 96822

来源：

ANALYTICAL CHEMISTRY | 1976年 / 48卷 / 06期

关键词：

D O I：

10.1021/ac60370a013

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

收藏

页码：843 / 846

页数：4

相关论文

共 14 条

[1] ALVAREZ R, UNPUBLISHED RESULTS
[2] ALVAREZ R, 1975, THESIS U HAWAII
[3] DIRECT OBSERVATION OF SURFACE-PROFILE EFFECTS ON X-RAY-PHOTOELECTRON ANGULAR-DISTRIBUTIONS
BAIRD, RJ
FADLEY, CS
KAWAMOTO, S
MEHTA, M
[J]. CHEMICAL PHYSICS LETTERS, 1975, 34 (01) : 49 - 54
[4] BAIRD RJ, 1975, 30TH NW REG M ACS HO
[5] THEORY OF FORMATION OF VERY THIN OXIDE FILMS ON METALS
BOGGIO, JE
PLUMB, RC
[J]. JOURNAL OF CHEMICAL PHYSICS, 1966, 44 (03) : 1081 - &
[6] BRUNNER J, 1974, J ELECTRON SPECTROSC, V5, P811
[7] SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY
FADLEY, CS
BAIRD, RJ
SIEKHAUS, W
NOVAKOV, T
BERGSTROM, SA
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 4 (02) : 93 - 137
[8] ANGULAR DISTRIBUTION OF PHOTOELECTRONS FROM A METAL SINGLE CRYSTAL
FADLEY, CS
BERGSTROM, SA
[J]. PHYSICS LETTERS A, 1971, A 35 (05) : 375 - +
[9] INSTRUMENTATION FOR SURFACE STUDIES - XPS ANGULAR-DISTRIBUTIONS
FADLEY, CS
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) : 725 - 754
[10] FADLEY CS, 1972, ELECTRON SPECTROSCOP, P233