CHARACTERIZATION OF LARGE DIAMETER SILICON BY LOW-BIAS CHARGE COLLECTION ANALYSIS IN SI(LI) PIN DIODES

被引：15

作者：

FONG, A

WALTON, JT

HALLER, EE

SOMMER, HA

GULDBERG, J

机构：

[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB, BERKELEY, CA 94720 USA

[2] UNIV CALIF BERKELEY, DEPT MAT SCI & MINERAL ENGN, BERKELEY, CA 94720 USA

[3] TOPSIL, DK-3600 FREDERIKSSUND, DENMARK

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1982年 / 199卷 / 03期

关键词：

D O I：

10.1016/0167-5087(82)90164-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：623 / 630

页数：8

共 17 条

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[17] THIN WINDOW SI(LI) DETECTORS FOR ISEE-C TELESCOPE [J].

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SOMMER, HA ;

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