ELECTRICAL-RESISTIVITY OF POLYCRYSTALLINE NIOBIUM NITRIDE FILMS

被引：56

作者：

NIGRO, A

NOBILE, G

RUBINO, MG

VAGLIO, R

机构：

来源：

PHYSICAL REVIEW B | 1988年 / 37卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.37.3970

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3970 / 3972

页数：3

共 9 条

[1] MICROSCOPIC INVESTIGATION OF NBN SPUTTERED FILMS [J].

GRAY, KE ;

KAMPWIRTH, RT ;

CAPONE, DM ;

VAGLIO, R .

PHYSICA B & C, 1985, 135 (1-3) :164-167

[2] ELECTRON-MICROSCOPY STUDY OF SPUTTERED NBN FILMS [J].

HO, HL ;

KAMPWIRTH, RT ;

GRAY, KE ;

CAPONE, DW ;

CHUMBLEY, LS ;

MESHII, M .

ULTRAMICROSCOPY, 1987, 22 (1-4) :297-303

[3] GROWTH AND PROPERTIES OF SINGLE-CRYSTAL TIN FILMS DEPOSITED BY REACTIVE MAGNETRON SPUTTERING [J].

JOHANSSON, BO ;

SUNDGREN, JE ;

GREENE, JE ;

ROCKETT, A ;

BARNETT, SA .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (02) :303-307

[4] ELECTRICAL-CONDUCTION IN CONCENTRATED DISORDERED TRANSITION-METAL ALLOYS [J].

MOOIJ, JH .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1973, 17 (02) :521-530

[5]

NIGRO A, UNPUB

[6] GRAIN-BOUNDARY RESISTANCE IN POLYCRYSTALLINE METALS [J].

REISS, G ;

VANCEA, J ;

HOFFMANN, H .

PHYSICAL REVIEW LETTERS, 1986, 56 (19) :2100-2103

[7] NONUNIVERSALITY OF THE MOOIJ CORRELATION - THE TEMPERATURE-COEFFICIENT OF ELECTRICAL-RESISTIVITY OF DISORDERED METALS [J].

TSUEI, CC .

PHYSICAL REVIEW LETTERS, 1986, 57 (15) :1943-1946

[8] MEAN FREE-PATH AND EFFECTIVE DENSITY OF CONDUCTION ELECTRONS IN POLYCRYSTALLINE METAL-FILMS [J].

VANCEA, J ;

HOFFMANN, H ;

KASTNER, K .

THIN SOLID FILMS, 1984, 121 (03) :201-216

[9] ELECTRON-MICROSCOPIC EVIDENCE FOR A COLUMNAR-VOID-TYPE STRUCTURE IN SPUTTERED NBN FILMS [J].

WAGNER, W ;

AST, D ;

GAVALER, JR .

JOURNAL OF APPLIED PHYSICS, 1974, 45 (01) :465-466

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